Abstract: This work presents an ultra-low quiescent current low-dropout regulator (LDO) IC chip with event-driven operation for low voltage IoT applications. The proposed LDO exploits a ...
Analysis of Single-Event Leakage Current Degradation Induced by Heavy-Ion Irradiation in SiC MOSFETs
Abstract: The application of silicon carbide MOSFETs (SiC MOSFETs) in space is severely restricted by single-event burnout (SEB) and single-event leakage current (SELC) induced by heavy ions, yet the ...
A grandfather and grandson fatally shot each other after an argument escalated at a southwest Austin home Monday, according to the Austin Police Department.
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