Diagram of an X-ray Reflectometry (XRR) setup: This schematic shows the arrangement of the X-ray tube, Gӧbel mirror, sample holder, and detector. The X-rays are emitted from the tube, shaped by slits ...

Dendritic structures that emerge during the growth of thin films are a major obstacle in large-area fabrication, a key step towards commercialization. However, current methods of studying dendrites ...

Accurately controlling film thickness and uniformity is extremely important for both throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. White ...

Thin films can be made from a variety of materials, including metals (e.g., gold, silver), oxides (e.g., silicon dioxide, titanium dioxide), and semiconductors (e.g ...

Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...

In this article, we explore how X-ray diffraction, also known as XRD, can be used to analyze thin films and the benefits of using this technique. Many materials are now processed in the form of thin ...

This study demonstrated that nanoscale boundary scattering could increase the phonon thermal conductivity in thin films, surpassing the limitations of traditional macroscale heat diffusion. Energy ...